"Auto-Labeling for Pattern Recognition of Wafer Defect Maps in Semiconductor Manufacturing", ASME Journal of Manufacturing Science and Engineering, 146, 7, 070904, 2024/07, SCI
"A New Vit-Based Augmentation Framework for Wafer Map Defect Classification to Enhance the Resilience of Semiconductor Supply Chains", International Journal of Production Economics, 273, 109275, 2024/07, SCI
"Sustainable Multi-biofuel Production with Stochastic Lead Time and Optimum Energy Utilization under Flexible Manufacturing", Computers & Industrial Engineering, 193, 110223, 2024/07, SCI
"Enterprise Intelligentization from Process Transformation to Artificial Intelligence Transformation", Journal of Industrial and Production Engineering, 41, 3, 201-216, 2024/03, SCI
"The impact of sales effort on a dual channel dynamical system under a price-sensitive stochastic demand", Journal of Retailing and Consumer Services, 76, 103561, 2024/01, SSCI
"Self-Assured Semi-Supervised Learning for Wafer Defect Pattern Classification", IEEE Transactions on Semiconductor Manufacturing, 36, 3, 404-415, 2023/08, SCI
"Effective Variational-Autoencoder-Based Generative Models for Highly Imbalanced Fault Detection Data in Semiconductor Manufacturing", IEEE Transactions on Semiconductor Manufacturing, 36, 2, 205-214, 2023/05, SCI
"Data-Driven Virtual Metrology and Re-Training Systems for Color Filter Processes of TFT-LCD Manufacturing", IEEE Transactions on Instrumentation and Measurement, 71, Art no. 1006912, 1-12, 2023/01, SCI
"Fault Diagnosis of Wafer Acceptance Test and Chip Probing between Front-End-of-Line and Back-End-of-Line Processes", IEEE Transactions on Automation Science and Engineering, 19, 4, 3068-3082, 2023/01, SCI
"Product-to-Product Virtual Metrology of Color Filter Processes in Panel Industry", IEEE Transactions on Automation Science and Engineering, 19, 4, 3496-3507, 2023/01, SCI
"Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing", IEEE Transactions on Automation Science and Engineering, 19, 3, 1530-1541, 2022/07, SCI
"Data Visualization of Anomaly Detection in Semiconductor Manufacturing", IEEE Transactions on Semiconductor Manufacturing, 35, 2, 186-197, 2022/05, SCI
"Data-driven optimization of accessory combinations for final testing processes in semiconductor manufacturing", Journal of Manufacturing Systems, 63, 275-287, 2022/04, SCI
"A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode", IEEE Transactions on Automation Science and Engineering, 18, 8, 1846-1860, 2021/10, SCI
"An Efficient No-Shutdown Pipe-Fixing Freezing Design for Water Management System in Hospitals during COVID-19: A Case Study", Water, 13, 19, 2725, 2021/10, SCI
"Auto-annotated deep segmentation for surface defect detection", IEEE Transactions on Instrumentation & Measurement, 70, 5011410, 1-10, 2021/06, SCI
"Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes", Advanced Engineering Informatics, 46, 101166, 1-11, 2020/10, SCI
"Data-Driven Approach for Fault Detection and Identification in Semiconductor Manufacturing", IEEE Transactions on Automation Science and Engineering, 17, 4, 1925-1936, 2020/10, SCI
"A Review on Fault Detection and Process Diagnostics in Industrial Processes", Processes, 8, 1123, 2020/09, SCI
"Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques", IEEE Transactions on Semiconductor Manufacturing, 32, 4, 544-551, 2019/11, SCI
"Fault detection and root cause analysis of batch process via novel nonlinear dissimilarity and comparative Granger causality analysis", Industrial and Engineering Chemistry Research, 58, 47, 21842-21854, 2019/11, SCI
"An Enhanced Partial Search to Particle Swarm Optimization for Unconstrained Optimization", Mathematics, 7, 353, 2019/04, SCI
"Profile Monitoring for Autocorrelated Reflow Processes with Small Samples", Processes, 7, 2, 104, 2019/01, SCI
"Nonlinear fault detection of batch processes based on functional kernel locality preserving projections", Chemometrics and Intelligent Laboratory Systems, 183, 79-89, 2018/12, SCI
"Using machine learning and big data approaches to predict travel time based on historical and real-time data from Taiwan electronic toll collection", Soft Computing, 22, 17, 5707-5718, 2018/09, SCI
"Preface: Special issue for the Asia Pacific Industrial Engineering and Management Systems (APIEMS) 2016 Conference", Engineering Optimization, 50, 7, 1097-1098, 2018/07, SCI
"Modelling Computer Recycling in Taiwan Using System Dynamics", Resources, Conservation & Recycling, 128, 167-175, 2018/01, SCI
"Automatic Vision-Based Grain Analysis of Multi-Crystalline Solar Wafers Using Hierarchical Region Growing", Engineering Optimization, 49, 4, 617-632, 2017/04, SCI
"Modeling and Monitoring Nonlinear Profile of Heat Treatment Process Data by Using A Hyperbolic Tangent Function Approach", Quality Engineering, 29, 2, 226-243, 2017/04, SCI
"Rainfall threshold assessment corresponding to the maximum allowable turbidity for source water", Water Environment Research, 88, 12, 2285-2291, 2017/01, SCI
"Wafer Fault Detection and Key Step Identification for Semiconductor Manufacturing Using Principal Component Analysis, AdaBoost and Decision Tree", Journal of Industrial and Production Engineering, 33, 3, 151-168, 2016/06, EI
"A New Multi-objective Particle Swarm Optimizer by Using Empirical Movement and Diversified Search Strategies", Engineering Optimization, 47, 6, 750-770, 2015/08, SCI
"Profile Monitoring of Reflow Process Using Approximations of Mixture Second-order Polynomials", Journal of Chemometrics, 28, 12, 815-833, 2015/01, SCI
"Establishment of turbidity forecasting model and early-warning system for source water turbidity management using back-propagation artificial neural network algorithm and probability analysis", Environment Monitoring and Assessment, 186, 8, 4925-4934, 2014/08, SCI
"A Trust Region Based Approach to Optimize Triple Response System", Engineering Optimization, 46, 5, 606-627, 2014/05, SCI
"Applying HBMO-based SOM in Predicting the Taiwan Steel Price Fluctuation", International Journal of Electronic Business Management, 12, 1, 1-14, 2014/03, EI
"Robust Multivariate Control Chart for Outlier Detection Using Hierarchical Cluster Tree in SW2", Quality and Reliability Engineering International, 29, 7, 971-985, 2013/11, SCI
"An Integrated Advanced Process Control Framework Using Run-to-Run Control, Virtual Metrology and Fault Detection", Journal of Process Control, 23, 7, 933-942, 2013/08, SCI
"Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine Functions", Quality & Reliability Engineering International, 29, 5, 743-758, 2013/07, SCI
"An Enhanced Case-Based Diagnosis Mechanism for Abnormal Production Administration", International Journal of Production Research, 51, 10, 3131-3142, 2013/05, SCI
"An Upside-down Normal Loss Function-based Method to Quality Improvement", Engineering Optimization, 44, 8, 935-945, 2013/02, SCI
"Disassembly and Recycling Cost Analysis of Waste Notebook and the Efficiency Improvement by Re-design Process", Journal of Cleaner Production, 39, 209-219, 2013/01, SCI
"A New Entropy-based Image Registration Method Using Image Intensity Difference", Machine Vision and Applications, 23, 4, 791-804, 2012/07, SCI
"Advanced Process Control Using Partial Least Squares", Advanced Materials Research, 542-543, 124-127, 2012/06, EI
"Prediction of Time-Varying Metrology Delay for dEWMA and RLS-LT Controllers", Journal of Process Control, 22, 4, 823-828, 2012/04, SCI
"Statistical Monitoring of Nonlinear Profiles by Using Piecewise Linear Approximation", Journal of Process Control, 21, 8, 1217-1229, 2011/09, SCI
"A New Search Procedure of Steepest Ascent in Response Surface Exploration", Journal of Statistical Computation & Simulation, 81, 6, 661-678, 2011/06, SCI
"An Image Registration Method Based upon Information Theorem on Overlapped Region", Applied Mechanics and Materials, 58-60, 1985-1989, 2011/05, EI
"A New Cross-Correlation Based Image Registration Method", Applied Mechanics and Materials, 58-60, 1979-1984, 2011/05, EI
研討會論文
"Self-Assured Deep Learning with Minimum-Pre-Labeled Data for Wafer Pattern Classification", International Workshop on Sustainable Systems (IWSS), Yeosu, 2024/05/02
"Construct the Auto-Label System for Defect Recognition of Wafer Probe Process in Semiconductor Manufacturing", The 23rd Asia Pacific Industrial Engineering & Management Systems Conference (APIEMS), Kuala Lumpur, 2024/01/22
"Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing", 17th IEEE International Conference on Automation Science and Engineering, Lyon, 2021/08/23
"Notebook Component Spare Parts Demand Forecasting by Using Machine Learning Approaches", 中國工業工程年會暨學術研討會, 雲林縣, 2020/11/21
"A Novel DEWMA Run-to-Run Control for Mixed-Product Mode", The 26th International Society for Business Innovation and Technology Management Conference, Budapest, 2019/04/22
"Construct a Novel Monitoring System for Classifying the Abnormal Voice Frequency Signals", the Asia Pacific Industrial Engineering & Management Systems Conference 2018, 香港, 2018/12/05
"Investigation of Exposure Compensation of Photolithography Processes in Semiconductor Manufacturing", The 7th Institute and Systems Engineers Asian Conference (IISEAsia2018), 台中, 2018/10/18
"Fault Detection of Etching Process in Semiconductor Manufacturing Using Random Forests", The 7th Institute and Systems Engineers Asian Conference (IISEAsia2018), 台中, 2018/10/18
"Travel Time Prediction and Prognosis of Taiwan Electronic Toll Data Using Big Data Approach", The 7th Institute and Systems Engineers Asian Conference (IISEAsia2018), 台中, 2018/10/18
"Key Parameter Identification for Faulty Wafer Detection Using Image Processing", The Fourteenth International Conference on Automatic and Autonomous Systems (ICAS 2018), Nice, 2018/05/20
"Using Model Selection in Mixture Polynomials to Construct the Nonlinear Profile Monitoring", The 18th Asia Pacific Industrial Engineering & Management Systems Conference, Yogjarkata, 2017/12/03
"Construct a monitoring system for dealing with the profile in auto-correlated process", The 21st International Society for Business Innovation and Technology Management Conference, 威尼斯, 2017/05/03
"Double EWMA Run-to-Run Controller for High Mixed Product Mode", The 17th Asia Pacific Industrial Engineering & Management Systems Conference, Taipei, 2017/01/01
"A Potential Big Data Analytics Approach: Performance Evaluation of Random Forests Classification", The International Congress on Engineering and Information, Osaka, 2016/05/10
"Grain Segmentation of solar cell wafers using region growing", MakeLearn & TIIM 2015 International Conference, Bari, 2015/05/27
"Fault Detection and Identification of Semiconductor Manufacturing Processes by Using a Blind Source Separation Approach", APC Conference XXV, Ann Arbor, Michigan, 2013/10/14
"Using Hyperbolic Tangent Function for Nonlinear Profile Monitoring", IIE Asian Conference 2013, Taipei, 2013/07/18
"Full Fault Detection for Semiconductor Processes Using Independent Component Analysis", IIE Asian Conference 2013, Taipei, 2013/07/18
"An Entropy-based Method for Color Image Registration", VISAPP 2013, 巴塞隆納, 2013/02/21
"An image registration method based on combined normalized mutual information and distance transform", IIE Asian Conference 2012, 新加坡, 2012/06/28
"Advanced process control framework in Taiwan's semiconductor industry", IIE Asian Conference 2012, 新加坡, 2012/06/28
