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國立臺北科技大學 學術資源網

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朴維鎮教授You-Jin Park

現職:
臺北科大/工業工程與管理系

期刊論文

  • "An artificial intelligence transformation model – pod redesign of photomasks in semiconductor manufacturing", Journal of Industrial and Production Engineering, 41, 3, 201-216, 2024/02, ELSE2
  • "Analysis of Electromagnetic Interference Effect on Semiconductor Scanning Electron Microscope Image Distortion", Applied Sciences, 14, 223, 2024/01, SCI
  • "A novel hybrid resampling for semiconductor wafer defect bin classification", Quality and Reliability Engineering International, 39, 67-80, 2023/02, SCI
  • "A New Hybrid Under-sampling Approach to Imbalanced Classification Problems", Applied Artificial Intelligence, 36, 1, 19, 2022/10, SCI
  • "A novel hybrid resampling for semiconductor wafer defect bin classification", Quality and Reliability Engineering International, 2022/07, SCI
  • "A new instance density-based synthetic minority oversampling method for imbalanced classification problems", Engineering Optimization, 16, 2021/10, SCI
  • "A New Hybrid Under-sampling Approach to Imbalanced Classification Problems", Applied Artificial Intelligence, 19, 2021/09, SCI
  • "Mining Shift Work Operation from Event Logs", Applied Sciences, 10, 20, 1-18 (7202), 2020/10, SCI
  • "A Review on Fault Detection and Process Diagnostics in Industrial Processes", Processes, 8, 9, 1-26 (1123), 2020/09, SCI
  • "Improvement of Productivity through the Reduction of Unexpected Equipment Faults in Die Attach Equipment", Processes, 8, 4, 1-18 (394), 2020/03, SCI
  • "A Membership Probability–Based Undersampling Algorithm for Imbalanced Data", Journal of Classification, 2020/01, SCI
  • "A Graphical Model to Diagnose Product Defects with Partially Shuffled Equipment Data", Processes, 12, 2019/12, SCI
  • "Interactive Q-Learning Approach for Pick-and-Place Optimization of the Die Attach Process in the Semiconductor Industry", Mathematical Problems in Engineering, 8, 2019/02, SCI
  • "Performance computation methods for composition of tasks with multiple patterns in cloud manufacturing", International Journal of Production Research, 14, 2019/01, SCI

研討會論文

  • "A Cluster Impurity-based Resampling Technique for Imbalanced Classification Problem", 11th International Conference on Logistics and Maritime Systems (LOGMS 2023), Pusan, 2023/09/04
  • "A Novel Hybrid Under-Sampling for Semiconductor Wafer Defect Bin Classification", 2022 International Symposium on Semiconductor Manufacturing Intelligence, Kinmen, 2022/11/11
  • "Application of Efficient Resampling Algorithms to Imbalanced Semiconductor Wafer Bin Classification Problem", International Conference on Operations Research - OR 2022, Karlsruhe, 2022/09/06
  • "Anomaly Detection-based Under-sampling for Imbalanced Classification Problems", IFCS2022 (17th Conference of the International Federation of Classification Societies), Porto, 2022/07/19
  • "Instance Density based Adaptive Hybrid Oversampling to Imbalanced Classification Problems", EURO 2022 Conference (32nd), Espoo, 2022/07/03
  • "Classification for Imbalanced Data Using Feature Selection and Undersampling Methods", ORBEL 34, Lille, 2020/01/30
  • "Real-Time Task Allocation Based on Collaboration Potential in Cloud Manufacturing", The 20th Asia Pacific Industrial Engineering And Management Systems (APIEMS 2019), Kanazawa, 2019/12/02
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