Van der Waals epitaxy growth and characterization of 7:7:8 commensurate heterointerfaces between h-AlN and two-dimensional WS2/c-Al2O3
作者 : Wei-Chun Chen*, Mu-Huan Lee, Kun-An Chiu, Wei-Lin Wang, Yen-Teng Ho, Yu-Wei Lin, Che-Chin Chen, Hung-Pin Chen, Shih-Feng Tseng, Hua-Lin Chen, Fong-Zhi Chen*
出版期刊 : ACS Applied Electronic Materials, 6(1), pp. 242-248, 2024